Announcement of JSM-7100F New FE SEM

From knowledgebase
Revision as of 09:38, 25 August 2020 by Dirkjan (talk | contribs) (Created page with "=URL= http://www.microscopy-news.com/news/announcement-of-jsm-7100f-new-fe-sem---high-performance-analytical-tool-with-improved-observation-and-analysis-functions--.html =Des...")
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)
Jump to navigation Jump to search

URL

http://www.microscopy-news.com/news/announcement-of-jsm-7100f-new-fe-sem---high-performance-analytical-tool-with-improved-observation-and-analysis-functions--.html

Description

An SEM has been used widely in a large variety of research and production fields. The JSM-7100F adopts the electron optics which has been proved to be the most powerful for high magnification observation and high precision analyses including crystal orientation analysis and cathode-luminescence as well as EDS and WDS.

Retrieved from "https://wiki.dirkjanswagerman.nl/index.php?title=Announcement_of_JSM-7100F_New_FE_SEM&oldid=3020"