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	<title>Announcement of JSM-7100F New FE SEM - Revision history</title>
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	<updated>2026-10-25T08:25:18Z</updated>
	<subtitle>Revision history for this page on the wiki</subtitle>
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		<title>Dirkjan: Created page with &quot;=URL= http://www.microscopy-news.com/news/announcement-of-jsm-7100f-new-fe-sem---high-performance-analytical-tool-with-improved-observation-and-analysis-functions--.html  =Des...&quot;</title>
		<link rel="alternate" type="text/html" href="https://wiki.dirkjanswagerman.nl/index.php?title=Announcement_of_JSM-7100F_New_FE_SEM&amp;diff=3020&amp;oldid=prev"/>
		<updated>2020-08-25T09:38:14Z</updated>

		<summary type="html">&lt;p&gt;Created page with &amp;quot;=URL= http://www.microscopy-news.com/news/announcement-of-jsm-7100f-new-fe-sem---high-performance-analytical-tool-with-improved-observation-and-analysis-functions--.html  =Des...&amp;quot;&lt;/p&gt;
&lt;p&gt;&lt;b&gt;New page&lt;/b&gt;&lt;/p&gt;&lt;div&gt;=URL=&lt;br /&gt;
http://www.microscopy-news.com/news/announcement-of-jsm-7100f-new-fe-sem---high-performance-analytical-tool-with-improved-observation-and-analysis-functions--.html&lt;br /&gt;
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=Description=&lt;br /&gt;
An SEM has been used widely in a large variety of research and production fields. The JSM-7100F adopts the electron optics which has been proved to be the most powerful for high magnification observation and high precision analyses including crystal orientation analysis and cathode-luminescence as well as EDS and WDS.&lt;br /&gt;
[[Category:microscopy]]&lt;br /&gt;
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[[Category:JEOL]]&lt;br /&gt;
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[[Category:SEM]]&lt;br /&gt;
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[[Category:bookmark]]&lt;br /&gt;
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[[Category:companies]]&lt;br /&gt;
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[[Category:microscopy]]&lt;/div&gt;</summary>
		<author><name>Dirkjan</name></author>
		
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